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Surface Analysis

Compact SIMS

Compact SIMS

Compact SIMS instrument optimised for depth profiling at the nanometer scale
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Súng ion Argon hoặc Oxygen 5keV dành cho các ứng dụng phân tích bề mặt UHV

IG20

A 5keV Argon or Oxygen ion source for UHV surface analysis applications
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ToF-qSIMS Workstation

ToF-qSIMS Workstation

Innovative Time of Flight Quadrupole SIMS System
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Hệ thống phổ khối ion thứ cấp (SIMS)

AutoSIMS

Automatic Surface Analysis System
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Súng ion Caesium 5keV cho các ứng dụng phân tích bề mặt UHV

IG5C

A 5keV Caesium ion gun for UHV surface analysis applications
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SIMS WORSTATION

SIMS Workstation

A UHV surface analysis system for thin film depth profiling
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Hệ thống máy phân tích khối phổ ion thứ cấp SIMS và SNMS tĩnh và động

MAXIM

A system for static and dynamic SIMS and SNMS applications
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