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Mass Spectrometers for Thin Films & Surface Engineering

SIMS Workstation, UHV SIMS instrument for thin film surface analysis, static SIMS, depth profiling, and imaging

Made by Hiden Analytical Ltd., UK. (website: http://www.hidenanalytical.com) The SIMS Workstation is a family of instruments based around a large multi-function UHV chamber. The instrument is designed to be flexible, both in terms of function and cost, so features can be addedor upgrades made as required. However, as a guide there …

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EQS SIMS Analyser, Bolt-on SIMS analyser for the analysis of secondary +ve and -ve ions from solid samples

The Hiden EQS is a high transmission quadrupole secondary ion mass spectrometry, SIMS, detector including a 45 degree electrostatic sector for simultaneous ion energy analysis. Ions are collected on the axis of the device which makes it very popular for fitting as an after-market detector to a wide variety of …

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