Mass Spectrometers for Thin Films & Surface Engineering

The Hiden IDP (Ion Disorption Probe)  is for the direct analysis of low energy ions from UHV surface science techniques. Applications include electron stimulated desorption, photon stimulated desorption and thermal desorption studies.

The Hiden TPD Workstation is a complete experimental system for UHV temperature programmed desorption (TPD) studies.The TPD Workstation features a multiport UHV chamber with heated sample stage coupled to a high precision triple filter analyser with digital pulse ion counting detector for ultimate sensitivity and time resolution. The triple filter mass …

Made by Hiden Analytical Ltd., UK. (website: http://www.hidenanalytical.com) The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling. The SNMS facility complements the SIMS technique, providing quantification for thin film composition measurements. Hiden’s new SIMS-on-a-Flange provides a complete SIMS facility …

The Hiden EQS is a high transmission quadrupole secondary ion mass spectrometry, SIMS, detector including a 45 degree electrostatic sector for simultaneous ion energy analysis. Ions are collected on the axis of the device which makes it very popular for fitting as an after-market detector to a wide variety of …

(Made by Hiden Analytical Ltd., UK. http://www.hidenanalytical.com) The Hiden MAXIM quadruple SIMS analyser is a state of the art secondary ion mass spectrometer for positive and negative, static, dynamic and neutral analytical applications. The MAXIM analyser system includes an integral energy filter for ion acceptance at 30° to the probe …